Advantages of Phasics wavefront sensors

High resolution of the phase map
The innovative technology developed by Phasics offers a high resolution phase map to the SID4 wavefront sensors range. The standard resolution is 160x120 measurement points and the highest is 400x300. The high resolution permits to measure precisely the aberrations of the lens with high measurement reproducibility.

Unique capability of measuring high diverging beam directly
Our technology of wavefront sensing has the unique capability of measuring directly the aberrations of an optical system without any additional relay lens (see image below). A calibrated beam passes through the lens to test. The sensor measures the deviation from a sphere of the wavefront transmitted. Though working with very diverging beams (up to 0.75 Numerical Aperture), no relay lens is necessary between the optical system and the sensor.

SID4 wavefront sensor - Optical set-up example

Achromaticity
The SID4 wavefront sensors can be used at different wavelength without additional calibration on the whole detection range of the camera and can be used with polychromatic light.

Easy to align
The SID4 wavefront sensors do not need a precise and long procedure of alignment. The analysis algorithm gives a very ease of use when aligning the wavefront sensor. When the source and the sensor are aligned, the optical system to test is directly put between the source and the SID4 sensor. It is then very easy to change the optical systems to test without any additional relay lens that could be difficult to align or that could add aberrations.

Ergonomics
The compactness of the SID4 wavefront sensors combined with the laptop and the user-friendly interface of the dedicated software KALEO for optical metrology make the system very ergonomic.

Dedicated software KALEO for optical metrology
The SID4 sensors used for optical metrology come with dedicated software Kaleo. It permits, in one measurement, to have a complete characterization of the optical quality of the component to test: aberrations, PSF, MTF, effective focal length, etc. … A fully customizable characterization report can be edited.