AWARDS 2006
International strategy trophy
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SCHEDULE |
Photonics West 2008
22 - 24 January
San José
USA
Information:
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Laser Optics Berlin 2008
17 - 19 March
Berlin
Germany
Plus d'infos
OPTATEC 2008
17 - 20 June
Frankfurt
Germany
Plus d'infos
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Contact Us |
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 Based on the Modified Hartmann Mask, PHASICS wave front sensors product line: SID4 propose at low cost new perspectives in wave front measurement for optical metrology and lasers applications.
- Ultra-high resolution (up to 300x400 points)
- High dynamic range
- Precision
- High numerical aperture
- Beam profiler module BEAMVIEW (exclusivity)
- Ergonomics and ease of use
SID4 device is associated to a control software with a friendly multi-user interface. It allows quick access to all the acquisition and analysis functions.
Discover our software and its numerous features.
SID4 wave front sensors product line is composed today of two devices:
- SID4 : It offers the optimal design features for laser applications. It's a high precision device for laser beam characterization and optical experiment alignments.
More information...
- SID4 HR : The High Resolution SID4 version (400 x 300 measurements points) increases applications field of wave front sensing for specific needs in optical metrology in production as well as in R&D.
More information...
 SID4 genuine features
- High resolution (160x120 points)
- Achromaticity
- High stability of the measurement
- Insensitive to vibration
- Ease of use, Firewire IEEE 1394
- Compactness: co,trolled with laptop
SID4 technological advantages
SID4 gives a phase and intensity map sampled on 160x120 measurement points and offers to the user a precise beam analysis.
From high resolution results:
High measurement reproducibility
A precise and rigorous optical aberration evaluation (Zernike, Legendre)
Our technology ensures a measurement precision of λ/200 RMS in an absolute mode and up to λ/1000 RMS in a relative mode.
Modified Hartmann mask is achromatic, measurement in coherent and incoherent light are possible (laser, LED, halogen source,...).
SID4 doesn't need an elaborate alignment procedure. Tilt measurement is independant of the global wave front measurement.
SID4 is insensitive to energy variations. Measurement is independent of intensities modulation of the analyzed source in the sensitivity range of the camera.
Ergonomics, SID4 is easy and quick to implement.
SID4 only needs a workshop calibration without any posterior calibration cheking.
SID4 is self referenced and so insensitive to vibrations.
SID4 includes an intuitive software with a fast and robust analysis method.
Know more about the software
SID4 detailed specifications
| Aperture dimension |
3.6 x 4.8 mm² |
| Spatial resolution |
29.6 µm |
| Sampling |
160 x 120 ( >19000 points ) |
| Wavelength range
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400 nm to 1100 nm |
| Dynamic range
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up to 150 λ (defocus) |
| Measurement sensitivity |
λ/100 RMS λ/500 RMS (relative mode) |
| Repeatability
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λ/500 RMS |
| Radius of curvature |
3 mm to +∞ (standard 20 mm) |
| Curvature repeatability |
5.10-4 m-1 |
| Numerical aperture |
up to 0.3 (standard 0.1) |
| Acquisition frequency |
up to 60 fps
(external trigger) |
| Real-time processing frequency |
>10Hz (full Resolution) |
| Dimensions (l x H x L) |
49 x 35 x 110 mm |
| Weight |
250 g |
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