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SID4 wavefront sensor genuine features - High resolution (160x120 points)
- Achromaticity
- High stability of the measurement
- Insensitive to vibration
- Ease of use, Firewire IEEE 1394
- Compactness : controlled with laptop
SID4 technological advantages 
- SID4 wavefront sensor gives a phase and intensity map sampled on 160x120 measurement points and offers to the user a precise laser beam analysis.
From high resolution results:
- High measurement reproducibility,
- A precise and rigorous optical aberration evaluation (Zernike, Legendre).
- Our lateral shearing interferometry technology ensures a measurement precision of λ/200 RMS in an absolute mode and up to λ/1000 RMS in a relative mode.
- Modified Hartmann mask is achromatic, measurement in coherent and incoherent light are possible (laser, LED, halogen source...).
- SID4 wavefront sensor does not need an elaborate alignment procedure. Tilt measurement is independant of the global wavefront measurement.
- SID4 is insensitive to energy variations. Measurement is independent of intensities modulation of the analyzed source in the sensitivity range of the camera.
- Ergonomics, SID4 is easy and quick to implement.
- SID4 wavefront sensor only needs a workshop calibration without any posterior calibration cheking.
- SID4 is self referenced and so insensitive to vibrations.
- SID4 includes an intuitive software with a fast and robust analysis method.
SID4 wavefront sensor detailed specifications | Aperture dimension | 3.6 x 4.8 mm2 |
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| Spatial resolution | 29.6 µm |
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| Sampling | 160 x 120 (> 19 000 points) |
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| Wavelength range | 350 nm to 1100 nm |
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| Precision (absolute/relative) | 10 nm RMS / 3 nm RMS |
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| Repeatability | 3 nm RMS |
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| Dynamic | > 100 µm |
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| Acquisition frequency | 60 fps |
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| Real-time processing frequency | > 10 fps (full resolution) |
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| Dimensions (l x H x L) | 49 x 35 x 110 mm |
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| Weight | 250 g |
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SID4 datasheet