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SID4 wavefront sensors are associated with a complete electromagnetic field analysis software. It integrates a high resolution phase map and at the same time the intensity profile and the phase map. Software description - Phase interpretation modules
- Tilt
- Divergence
- Zernike polynomials
- Legendre polynomials
- Beam alignment assistant - Ergonomics
- Intuitive software
- Multi-user interface
- Automatic mask adjustement - Laser beam analysis
- Phase and Intensity
- M² measurement
- Strehl Ratio
- Far-Field analysis - Beam View (option)
- Complete beam analysis
- Intensity profiles
- Gaussian fit
Software advantages for laser metrology - SID4 high resolution offers an accurate analysis of the results
- Software analyses circular or rectangular pupils and automatically adapts to the right projection base: Zernike or Legendre
- SID4 lateral shearing interferometry technology allows an easy alignment procedure: Fourier Transform analysis strongly reduces tip/tilt alignment
- Different users measurement parameters are associated with a specific profile allowing a multi-user access
- With programming module library (Software Development Kit) in Labview and C++, you can include phase measurement and various interpretation modules in your own programs for a customized use
Beamview With Beamview, SID4 allows at the same time strong laser beam wavefront and intensity profiles. 
This feature in the software enables making an intensity profile characterization.
It gives the following information : - Position of intensity maximum from camera centre (in mm,µm)
- Position of intensity centroid from camera centre (in mm,µm)
- Beam diameter at 1/e², FWHM
- Ellipticity, angle
- X,Y and arbitrary line-out Gaussian fit
- Results and pictures saved to disk
- Background noise processing
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