SID4 NIR: High resolution wavefront sensor surface inspection

SID4 NIR front view

PHASICS introduces its high resolution wavefront sensor for near IR region (from 1.5 µm to 1.6 µm): the SID4 NIR.

For optical metrology, the SID4 NIR is the perfect tool to characterize IR objectives or IR lenses giving you aberrations, PSF, MTF and focal length and analyzing surface quality.

The ease of use and compactness make the SID4 NIR very simple to integrate.

SID4 NIR wavefront sensor key features

High resolution (160 x 120)
Phase map interpretation modules
Intensity profile characterization
Absolute measurement
Fast measurement
Insensitive to vibration
Cost effective

SID4 NIR detailed specifications

Aperture dimension	3.6 x 4.8 mm²
Spatial resolution	29.6 µm
Sampling	160 x 120
Wavelength range	1.5 - 1.6 µm
Accuracy	> 15 nm RMS
Sensitivity	< 11 nm RMS
Dynamic	> 100 µm
Analysis rate	< 10 fps
Acquisition rate	60 fps
Dimensions (l x H x L)	44x33x57.5 mm
Weight	250 g

SID4 NIR datasheet