SID4 MWIR: High resolution wavefront sensor

PHASICS introduces the first off-the-shelf high resolution wavefront sensor for medium wavelength IR region (from 3 µm to 5 µm): the SID4 MWIR.

For laser beam metrology (MWIR OPO laser sources…), the SID4 MWIR gives an exhaustive laser beam characterization (aberrations, M², intensity profiles, beam parameters ...).

For optical metrology, the SID4 MWIR is the perfect tool to characterize IR objectives or IR lenses giving you wavefront aberrations, surface quality, PSF, MTF and focal length.

The ease of use and compactness make the SID4 MWIR very simple to integrate

SID4 MWIR wavefront sensor key features

High resolution (96 x72)
Broadband
Absolute measurement
High Numerical Aperture measurement for analysis without any additional relay lens
Fast measurement
Insensitive to vibration
Optional module available for simple off-axis measurement
Cost effective

SID4 MWIR detailed specifications

Aperture dimension	13.44 x 10.08 mm²
Spatial resolution	140 µm
Sampling	96 x 72
Wavelength range	3 - 5 µm
Accuracy	> 25 nm RMS
Sensitivity	< 75 nm RMS
Analysis rate	20 fps
Acquisition rate	50 fps
Dimensions (l x H x L)	55x55x60 mm
Weight	250 g

SID4 MWIR datasheet