SID4 LWIR: Infrared wavefront sensor

PHASICS introduces the first off-the-shelf high resolution wavefront sensor for long wavelength IR region (from 8 µm to 14 µm): the SID4 LWIR.

The SID4 LWIR advantages come from the 4-Wave Lateral Shearing Interferometry technology and is based on an uncooled focal plane array technology which makes it compact, easy to use and to integrate to a metrological measurement bench or to a laser chain.

For optical metrology, the SID4 LWIR is the perfect tool to characterize IR objectives (thermal imaging, security & safety vision…) or IR optical components (for CO2 laser…) giving you aberrations, surface quality, PSF, MTF and focal length. The SID4 LWIR is particularly adapted to industry needs and allows a complete diagnostic of the lens quality in one measurement. We also propose a specific module for off-axis measurement.

• The SID4 LWIR allows the analysis of optical components, such as lenses or windows made of infrared materials like Germanium or Zinc Selenide (ZnSe) directly in their specific spectral range of use.
• The analysis of lens aberrations is achieved direcly without any relay lens. A calibrated beam passes trough the lens. The sensor measures the deviation from a sphere of the wavefront transmitted.
• Thanks to its braodband spectral range (from 8 to 14µm), The calibrated beam can either be generated with a CO2 laser source (λ=10,6µm) or with a black body.
• Each lens characterization is accompanied by a complete diagnostic report giving the aberrations cartography, the Zernike polynomials decomposition, the PSF and MTF, … . This report is customizable in function of your specific needs.

• The maps of phase and intensity of your laser are given simultaneously.
• The software offers a complete beam analysis with the measurement of the M² parameter, the Strehl ratio, the intensity profiles, the beam parameters, ….
• Wavefront sensing is also particularly helpful during the alignment of optical components.

• High resolution (96 x72)
• Broadband
• Absolute measurement
• High Numerical Aperture measurement for analysis without any additional relay lens
• Fast measurement
• Insensitive to vibration
• Optional module available for simple off-axis measurement
• Cost effective

• Analysis of optical components (lenses, window, …) made of infrared materials like Germanium or ZnSe
• Analysis of thermal objectives for LWIR vision (thermal imaging, security & safety vision …)
• Analysis of CO2 laser optical components at λ=10 ,6µm.
• LWIR OPO beam metrology
• QCL source

SID4 LWIR datasheet