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SID4 DWIR: High resolution dual band wavefront sensor

PHASICS introduces the first off-the-shelf high resolution wave front sensor for dual band infrared (from 3 µm to 5 µm and from 8 µm to 14 µm): the SID4 DWIR.

For optical metrology, the SID4 DWIR is the perfect tool to characterize IR objectives (thermal imaging and safety vision) or IR lenses (for CO2 laser) giving you MTF, PSF, as well as aberrations, surface quality and focal length.

 For laser beam metrology (CO2 laser, infrared OPO laser sources…), the SID4 DWIR gives an exhaustive beam characterization (aberrations, M², intensity profiles, beam parameters ...).

The ease of use and compactness make the SID4 DWIR very simple to integrate

SID4 DWIR wavefront sensor key features
  • High resolution (96 x72)
  • Absolute measurement
  • MWIR band & LWIR band
  • Broadband
  • High Numerical Aperture measurement for analysis without any additional relay lens
  • Fast measurement
  • Insensitive to vibration
  • Optional module available for simple off-axis measurement
  • Cost effective
SID4 DWIR detailed specifications
Aperture dimension 13.44 x 10.08 mm²
Spatial resolution 140 µm
Sampling 96 x 72
Wavelength ranges 3 - 5 µm and 8 - 14 µm
Accuracy 75 nm RMS
Sensitivity 25 nm RMS
Analysis rate 20 fps
Acquisition rate 50 fps
Dimensions (l x H x L) 85 x 116 x 179 mm
Weight Approx. 1.6kg