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SID4 Wavefront sensors for laser beam analysis

SID4 wavefront sensor

Based on the Modified Hartmann Mask, PHASICSTM wavefront sensors product line: SID4 propose at low cost new perspectives in wavefront measurement for optical metrology and lasers applications.

  • Ultra-high resolution (up to 300x400 points)
  • High dynamic range
  • Precision
  • High numerical aperture
  • Beam profiler module BEAMVIEW (exclusivitie)
  • Ergonomics and ease of use

SID4 wavefront sensors product line is composed today of six devices and one software:

SID4 wavefront sensor is associated to a control software with a friendly multi-user interface. It allows quick access to all the acquisition and analysis functions.

It offers the optimal design features for laser applications. It's a high precision device for laser beam characterization and optical experiment alignments.

The High Resolution SID4 version (400 x 300 measurements points) increases applications field of wave front sensing for specific needs in optical metrology in production as well as in R&D.

PHASICS extends the SID4 product line to UV wavelengths, from 190 nm to 400 nm.

PHASICS introduces its high resolution wavefront sensor for near IR region (from 1.5 µm to 1.6 µm).

PHASICS introduces the first off-the-shelf high resolution wavefront sensor for dual band infrared (from 3 to 5 µm and from 8 to 14 µm).