Optics quality characterization software

By associating the optical metrology software with a wavefront sensor from the SID4 range, you obtain a complete optics quality diagnostics tool: aberration measurement, PSF, MTF, focal length... Easy to install and without any relay lens, the SID4 wavefront sensor is completely adapted to optical metrology.

The 4-wave lateral shearing interferometry technology of wavefront sensing used by Phasics allows measuring lens aberrations without any relay lens.
A calibrated light beam passes through the lens. The sensor measures the deviation from a sphere of the wavefront transmitted.
Though working with very divergent beams (upto f/1), no relay lens is necessary between the lens and the sensor.

• Lens database
• Management of user profiles
• Module to set the measurement parameters:
  - preview window for phase and intensity
  - main Zernike polynomes
• Post-analysis of phase maps:
  - definition of analysis sub-pupil
  - application of filters
• Final measurement report, entirely customizable:
  - aberration map
  - Zernike polynomes
  - PSF
  - MTF
  - focal length

• Ease of use
• Simultaneous aberration, MTF, PSF and focal length measurements
• High resolution of phase and intesity maps
• Masking of aberration points
• Direct measurement of divergent beam