PHASICS^TM Kaleo product line measures at the same time the aberrations and the MTF of spherical and aspherical optics. The automatic version allows, with a few seconds, to determine most of the optics parameters (including focal length, MTF, abberations, ...).

• Ultra-high resolution (up to 300x400 points)
• High dynamic range
• Precision
• High numerical aperture
• Beam profiler module BEAMVIEW (exclusivitie)
• Ergonomics and ease of use

The Kaleo system product line is composed today of one software and four devices:

The dedicated optical metrology software, combined with the SID4 wavefront sensors product range, offers a complete diagnostics tool for optics quality.

Kaleo-T (T for transmission) allows the complete characterization of spherical, aspherical lenses, photo objectives. It measures simultaneouly aberrations, PSF, MTF... Based on the innovative technology 4-wave Lateral shearing interferometry, it allows the characterization of highly opened optics without any relay lens.

The Kaleo-R (R for Reflection) system allows the measurement in reflection of various parameters (radius of curvature, surface quality, ...) for optics surface quality.

Kaleo-i machine characterizes the optique quality of your intraocular lenses.