|
Phasics present at Photonics West 2009 |
|
|
|
|
PHASICS will be present at Photonics West 2009 in San Jose, January 27-29, 2009 on booth #1611. During the exhibition, visitors will be able to discover our adaptive optics loop based on SID4 wavefront sensor and OASys software to drive deformable mirror. Laser characterization - Wave front sensors
PHASICS manufactures high resolution wave front sensors (SID4) based on an innovative and patented technology: 4-wave lateral Shearing Interferometry, which offers the optimal design features for laser characterization and optical metrology: sensitivity, high resolution and dynamic range measurement. This SID4 device gives, in one measurement, the main information for a complete characterization of your beam: - the wavefront of your beam with the aberrations (high resolution phase map up to 160x120 measurement points);
- the intensity profiles with a Gaussian fit, beam size, ellipticity;
- M² value (according to ISO11146 standard) and Strehl ratio for the beam quality.
- Adaptive optic loops
PHASICS adaptive optics systems offer the prospect of beam focusing optimization and beam shaping in real time. For imaging systems, we ensure diffractive limited performances. OASys includes our high performance SID4 wave front sensor, a deformable mirror and the software to drive both the analyser and the deformable mirror, all best suited to your application. The OASys software is dedicated to control the correction device (deformable mirror, SLM or deformable membrane) and is linked to the SID4 main interface software.
Optical metrology needs - Lens quality diagnostics
Kaleo measures at the same time the aberrations, the focal length and the MTF of spherical and aspherical optics. Our innovative technology allows characterizing highly opened optics (up to f/1.6) without any relay lens. Kaleo is particularly adapted to industry needs and allows a complete diagnostic of the lens quality.
|
|
|
|
|