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PHASICS S.A. XTEC Bât. 404, Campus de l'Ecole Polytechnique, Route de Saclay, 91128 Palaiseau, FRANCE | Tel : +33 1 69 33 89 99 / 89 95, Fax : +33 1 69 33 89 88 Email :info@phasics.fr

 

Quality control, quality assurance, wavefront sensor, wavefront sensing, phase control, phase measurement, Shack Hartmann, modified Hartmann mask, 4-Wave Lateral Shearing Interferometry, optical metrology, optics measurement, metrology, high resolution, accuracy.
Applications: IOL, intraocular lens, ophtamology, toric IOL, aspherical IOL, multifocal IOL, cell morphology, cell imaging, phase imaging, laser, laser metrology, laser beam characterization, adaptive optics, beam shaping, , mirror control, laser beam shaping, surface characterization, surface inspection, asphere, aspherical surface, whole surface, entire surface, asphere characterization, aspherical surface, high precision optics, wafer level optics, micro optics