PHASICS proposes wave front characterization and correction solutions for light beam.
High precision devices manufactured by PHASICS answer directly optical metrology needs in production as well as in R&D for lens characterization, aspherical, complex system aberration measurement,...

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Ophthalmology
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- High resolution eye imaging in situ
- Measurement of eye aberrations in real-time
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Biological imaging
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- In vivo imaging
- SID4 associated to microscope
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